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Luhn algorithm. The Luhn algorithm or Luhn formula, also known as the " modulus 10" or "mod 10" algorithm, named after its creator, IBM scientist Hans Peter Luhn, is a simple check digit formula used to validate a variety of identification numbers. It is described in US patent 2950048A, granted on 23 August 1960. [ 1]
The algorithmic state machine ( ASM) is a method for designing finite state machines (FSMs) originally developed by Thomas E. Osborne at the University of California, Berkeley (UCB) since 1960, [ 1] introduced to and implemented at Hewlett-Packard in 1968, formalized and expanded since 1967 and written about by Christopher R. Clare since 1970 ...
The original Verilog simulator, Gateway Design's Verilog-XL was the first (and only, for a time) Verilog simulator to be qualified for ASIC (validation) sign-off. After its acquisition by Cadence Design Systems, Verilog-XL changed very little over the years, retaining an interpreted language engine, and freezing language-support at Verilog-1995.
In computing, a linear-feedback shift register ( LFSR) is a shift register whose input bit is a linear function of its previous state. The most commonly used linear function of single bits is exclusive-or (XOR). Thus, an LFSR is most often a shift register whose input bit is driven by the XOR of some bits of the overall shift register value.
The following example is an up-counter with asynchronous reset, parallel load and configurable width. It demonstrates the use of the 'unsigned' type, type conversions between 'unsigned' and 'std_logic_vector' and VHDL generics. The generics are very close to arguments or templates in other traditional programming languages like C++.
The Luhn mod N algorithm is an extension to the Luhn algorithm (also known as mod 10 algorithm) that allows it to work with sequences of values in any even-numbered base. This can be useful when a check digit is required to validate an identification string composed of letters, a combination of letters and digits or any arbitrary set of N ...
Design for testing. Design for testing or design for testability ( DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware ...
A recount of the votes cast in the Republican primary in Virginia's 5th Congressional District will be held on July 31 to decide whether a challenger backed by former President Donald Trump will ...